Reza Zoughi

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Iowa State University (ISU)

R. Zoughi is the Kirby Gray (Battelle) Chair in Engineering and a Professor Electrical and Computer Engineering (ECpE) at Iowa State University (ISU). He is also the Director of Center for Nondestructive Evaluation (CNDE) at ISU. He served as the Schlumberger Endowed Professor of Electrical and Computer Engineering at Missouri University of Science and Technology (Missouri S&T, formerly Missouri-Rolla) from January 2001 to August 2019. Prior to joining Missouri S&T and since 1987 he was with the Electrical and Computer Engineering Department at Colorado State University (CSU). Dr. Zoughi held the position of Business Challenge Endowed Professor of Electrical and Computer Engineering from 1995 to 1997 while at CSU. He is the author of a textbook entitled “Microwave Nondestructive Testing and Evaluation Principles” KLUWER Academic Publishers, 2000, and the co-author of a chapter on Microwave Techniques in the book entitled “Nondestructive Evaluation: Theory, Techniques, and Applications” Marcel and Dekker, Inc., 2002. He is the co-author of 182+ refereed journal papers, 380+ conference proceedings and presentations and 120 technical reports. While at CSU he received nine teaching awards, including the State Board of Agriculture, Excellence in Undergraduate Teaching Award and the Abell Faculty Teaching Award. Since at Missouri S&T he has received seventeen Outstanding Teaching Awards & Commendations. He is the recipient of the 2007 IEEE Instrumentation and Measurement Society Distinguished Service Award, the 2009 American Society for Nondestructive Testing (ASNT) Research Award for Sustained Excellence, the 2011 IEEE Joseph F. Keithley Award in Instrumentation and Measurement and the 2020 IEEE Instrumentation and Measurement Society Career Excellence Award. In 2013 and 2020 he and his co-authors received the H. A. Wheeler Applications Prize Paper Award from the IEEE Antennas and Propagation Society (APS). He served as the Editor-in-Chief of the IEEE Transactions on Instrumentation and Measurement (2007-2011), three terms as an at-large AdCom member of the IEEE Instrumentation and Measurement (I&M) Society, I&M Society President (2014-2015) and serves as an I&M Society Distinguished Lecturer. He has twenty issued US patents to his credit (in addition to several issued abroad) in the field of microwave nondestructive testing and evaluation. He has delivered numerous Invited and Keynote presentations on the subject of microwave and millimeter wave nondestructive testing and imaging. He is a Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and a Fellow of the American Society for Nondestructive Testing (ASNT).

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