The 30th edition of the American Society for Nondestructive Testing’s annual Research Symposium will take place in St. Louis, MO, on June 20-23. Some key speakers for this event will include:
- Dr. Cara Campbell-Leckey of NASA Langley Research Center
- Dr. Surendra Singh of Honeywell Aerospace
- Dr. Megan McGovern of General Motors Corporation
Topics will cover a wide range of subjects, including:
- AI/ML possibilities
- High-resolution microwave imaging + applications
- Modeling & simulation
- Technology innovation
- Additive manufacturing
- Materials characterization
- Nuclear applications